IEEE - Institute of Electrical and Electronics Engineers, Inc. - A stimulus-free probabilistic model for single-event-upset sensitivity

Proceedings. 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems and Design

Author(s): Thara Rejimon ; Sanjukta Bhanja
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hyderabad, India, India
Conference Date: 3 January 2006
ISBN (Paper): 0-7695-2502-4
ISSN (Paper): 1063-9667
DOI: 10.1109/VLSID.2006.26
Regular:

With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as single-event-upset (SEU), is a growing concern in logic circuits. Accurate... View More

Advertisement