IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental study on UHF passive RFID readability degradation

Proceedings. International Symposium on Applications and the Internet Workshops

Author(s): J. Mitsugi ; H. Hada
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Phoenix, AZ, USA
Conference Date: 23 January 2006
ISBN (Paper): 0-7695-2510-5
DOI: 10.1109/SAINT-W.2006.17
Regular:

Readability of passive RFID fundamentally depends on the tag empowering. The minimum required power, usually referred to as sensitivity, depends on the chip and antenna manufacturing. The... View More

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