IEEE - Institute of Electrical and Electronics Engineers, Inc. - Coverage measurement for software application testing using partially ordered domains and symbolic trajectory evaluation techniques

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): A. Cheng ; A. Parashkevov ; Cheng-Chew Lim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.26
Regular:

Ensuring the functional correctness of a SoC is essential for successful design projects. A proven and effective method from Freescale Semiconductor Australia is to employ software application... View More

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