IEEE - Institute of Electrical and Electronics Engineers, Inc. - Current testable design of resistor string DACs

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): M. Hashizume ; T. Nishida ; H. Yotsuyanagi ; T. Tamesada ; Y. Miura
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.28
Regular:

In this paper, supply current testability is examined experimentally for opens and shorts in a general 3 bit resistor string digital/analog converter (DAC). The results show that all of the shorts... View More

Advertisement