IEEE - Institute of Electrical and Electronics Engineers, Inc. - Industry-academia collaboration in undergraduate test engineering unit development

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): S. Demidenko ; V. Lai ; Z.A. Kassim
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.58
Regular:

There is a permanent shortage of qualified test engineers in the electronic industry and R&D organizations, thus leading to a high demand for such staff. Addressing the issue, leading electronic... View More

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