IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of high-speed metal-semiconductor-metal photodetectors: an optimization-based approach

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): Kan-Lin Hsiung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.33
Regular:

The finger sizing of interdigitated Schottky-barrier metal-semiconductor-metal photodetectors (MSM-PD) is discussed in this paper. We observe that a MSM-PD geometry with fast response speed... View More

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