IEEE - Institute of Electrical and Electronics Engineers, Inc. - CMOS Schottky diode microwave power detector fabrication, SPICE modeling, and applications

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): W. Jeon ; J. Melngailis ; R.W. Newcomb
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.22
Regular:

CMOS Schottky diodes with various contact areas and geometries were fabricated through 0.35/spl mu/ CMOS process. Fabricated diodes were tested under DC and RF direct injection. Based on the... View More

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