IEEE - Institute of Electrical and Electronics Engineers, Inc. - Some common aspects of design validation, debug and diagnosis

Third IEEE International Workshop on Electronic Design, Test and Applications

Author(s): T. Arnaout ; G. Bartsch ; H.J. Wunderlich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kuala Lumpur, Malaysia
Conference Date: 17 January 2006
ISBN (Paper): 0-7695-2500-8
DOI: 10.1109/DELTA.2006.79
Regular:

Design, verification and test of integrated circuits with millions of gates put strong requirements on design time, test volume, test application time, test speed and diagnostic resolution. In... View More

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