IEEE - Institute of Electrical and Electronics Engineers, Inc. - e-Risk Management with Insurance: A Framework Using Copula Aided Bayesian Belief Networks

Proceedings of the 39th Annual Hawaii International Conference on System Sciences

Author(s): A. Mukhopadhyay ; S. Chatterjee ; D. Saha ; A. Mahanti ; S.K. Sadhukhan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kauia, HI, USA, USA
Conference Date: 4 January 2006
Volume: 6
ISBN (Paper): 0-7695-2507-5
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2006.138
Regular:

e-business organizations are heavily dependent on distributed 24X7 robust information computing systems, for their daily operations. To secure distributed online transactions, they spend millions... View More

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