IEEE - Institute of Electrical and Electronics Engineers, Inc. - Framework for Analyzing Critical Incident Management Systems (CIMS)

Proceedings of the 39th Annual Hawaii International Conference on System Sciences

Author(s): Jin Ki Kim ; R. Sharman ; H. Raghav Rao ; S. Upadhyaya
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kauia, HI, USA, USA
Conference Date: 4 January 2006
Volume: 4
ISBN (Paper): 0-7695-2507-5
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2006.188
Regular:

Critical incident management systems (CIMS) are information systems used to deal with day to day occurring emergencies as well as to mitigate major catastrophic events which can be man-made (9/11... View More

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