IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dealing with Risk in Incident Management: An Application of High Reliability Theory

Proceedings of the 39th Annual Hawaii International Conference on System Sciences

Author(s): G. Van Den Eede ; B. Van de Walle ; A. Rutkowski
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Kauia, HI, USA, USA
Conference Date: 4 January 2006
Volume: 2
ISBN (Paper): 0-7695-2507-5
ISSN (Paper): 1530-1605
DOI: 10.1109/HICSS.2006.112
Regular:

In this paper we investigate the application of High Reliability Theory (HRT) to the field of operational risk management. In particular, we illustrate how HRT can contribute to the analysis of... View More

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