IEEE - Institute of Electrical and Electronics Engineers, Inc. - Site-specific modeling tools for predicting the impact of corrupting mainbeam targets on STAP

2005 IEEE International Radar Conference Record

Author(s): K. Ohnishi ; J.S. Bergin ; C.M. Teixeira ; P.M. Techau
Sponsor(s): Nat. Capital Area Council
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Arlington, VA, USA
Conference Date: 9 May 2005
Page Count: 6
Page(s): 393 - 398
ISBN (Paper): 0-7803-8881-X
DOI: 10.1109/RADAR.2005.1435857
Regular:

This paper provides details about modeling tools being developed under the Defense Advanced Research Projects Agency's (DARPA) knowledge-based sensor signal processing and expert reasoning... View More

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