IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of two analytical methods: differential scanning calorimetry and shrink temperature

2005 IEEE 31st Annual Northeast Bioengineering Conference

Author(s): R.C. Rao ; M.C. Wang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Hoboken, NJ, USA
Conference Date: 2 April 2005
Page Count: 2
Page(s): 108 - 109
ISBN (Paper): 0-7803-9105-5
ISBN (Online): 0-7803-9106-3
DOI: 10.1109/NEBC.2005.1431948
Regular:

The premise of this paper is to provide an understanding of two very similar analytical test methods that are often used in corporate quality control testing: the differential scanning calorimetry... View More

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