IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computer-aided engineering (CAE) applications in semiconductor device manufacturing and reliability

2005 IEEE Workshop on Microelectronics and Electron Devices

Author(s): S. Groothuis ; R. Meade
Sponsor(s): IEEE Electron Devices Soc. - Boise Chapter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Boise, ID, USA
Conference Date: 15 April 2005
Page Count: 4
Page(s): 45 - 48
ISBN (Paper): 0-7803-9072-5
DOI: 10.1109/WMED.2005.1431614
Regular:

With the ever increasing complexity of semiconductor device designs, the need for designed-in manufacturability and reliability continues to present a challenge for successful semiconductor... View More

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