IEEE - Institute of Electrical and Electronics Engineers, Inc. - The anatomy of nanometer timing failures

Proceedings. European Test Symposium. ETS 2005

Author(s): C. Hawkins ; J. Segura
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Tallinn, Estonia, Estonia
Conference Date: 22 May 2005
Page(s): 210 - 215
ISBN (Paper): 0-7695-2341-2
DOI: 10.1109/ETS.2005.42
Regular:

Timing failures have been with CMOS ICs forever. Initially, timing failures were comparatively minor, but are now are a plague in many products. This article summarizes the timing properties of... View More

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