IEEE - Institute of Electrical and Electronics Engineers, Inc. - Built-in self-test of molecular electronics-based nanofabrics

Proceedings. European Test Symposium. ETS 2005

Author(s): Z. Wang ; K. Chakrabarty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Tallinn, Estonia, Estonia
Conference Date: 22 May 2005
Page(s): 168 - 173
ISBN (Paper): 0-7695-2341-2
DOI: 10.1109/ETS.2005.10
Regular:

We propose a built-in self-test (BIST) procedure for nanofabrics based on chemically-assembled electronic nanotechnology. We also present a recovery procedure through which we can identify... View More

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