IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design validation of behavioral VHDL descriptions for arbitrary fault models

Proceedings. European Test Symposium. ETS 2005

Author(s): Fei Xin ; M. Ciesielski ; I.G. Harris
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Tallinn, Estonia, Estonia
Conference Date: 22 May 2005
Page(s): 156 - 161
ISBN (Paper): 0-7695-2341-2
DOI: 10.1109/ETS.2005.14
Regular:

In this paper we present a flexible automatic test generation framework to detect a variety of design faults in systems with behavioral VHDL descriptions. Predefined fault models may range from... View More

Advertisement