IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault collapsing for flash memory disturb faults

Proceedings. European Test Symposium. ETS 2005

Author(s): M.G. Mohammad ; L. Terkawi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Tallinn, Estonia, Estonia
Conference Date: 22 May 2005
Page(s): 142 - 147
ISBN (Paper): 0-7695-2341-2
DOI: 10.1109/ETS.2005.24
Regular:

Disturb failures are considered the most predominant failure mode in flash memories. Disturb faults are highly dependant on the core memory cell structure, manufacturing technology, and array... View More

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