IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated in-camera detection of flash eye-defects

2005 Digest of Technical Papers. International Conference on Consumer Electronics

Author(s): P. Corcoran ; P. Bigioi ; E. Steinberg ; A. Pososin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Las Vegas, NV, USA
Conference Date: 8 January 2005
Page Count: 2
Page(s): 129 - 130
ISBN (Paper): 0-7803-8838-0
DOI: 10.1109/ICCE.2005.1429751
Regular:

This work examines the problem of performing automatic real-time detection of flash eye defects (redeye) in the firmware of a digital camera. Several different algorithms are compared, and timing... View More

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