IEEE - Institute of Electrical and Electronics Engineers, Inc. - Three-layered traceability system supporting both blanching and assembly process

2005 IEEE International Technology Management Conference (ICE)

Author(s): Takeo Takeno ; Azuma Okamoto ; Mitsuyoshi Horikawa ; Toshifumi Uetake ; Mitsumasa Sugawara
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2005
Conference Location: Munich, Germany
Conference Date: 20 June 2005
Page(s): 1 - 8
ISBN (Paper): 978-0-85358-221-2
DOI: 10.1109/ITMC.2005.7461288
Regular:

Under variety production circumstances, it becomes more important to manage production and distribution history information of each individual product. Information system tracing the history is... View More

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