IEEE - Institute of Electrical and Electronics Engineers, Inc. - Potentials and Limits of Graph-Algorithms for Discovering Ontology Patterns

Proceedings. 2006 International Conference on Intelligence For Modelling, Control and Automation. Jointly with International Conference on Intelligent Agents, Web Technologies and Internet Commerce

Author(s): C. Thorn ; O. Eriksson ; E. Blomqvist ; K. Sandkuhl
Sponsor(s): IEEE Comput Intelligence Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Vienna, Austria
Conference Date: 28 November 2005
Volume: 1
Page(s): 174 - 179
ISBN (Paper): 0-7695-2504-0
DOI: 10.1109/CIMCA.2005.1631261
Regular:

The aim of the research presented in this paper is to contribute to reduction of development time for ontologies by discovering reusable parts and patterns. The approach is to use existing... View More

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