IEEE - Institute of Electrical and Electronics Engineers, Inc. - Influence of outside environment on transient grounding resistance under pulsed discharging current

IEEE 2005 International Symposium on Microwave, Antenna, Propagation and EMC Technologies for Wireless Communications

Author(s): He Hongbing ; Zhou Bihua ; Chen Jiaqing ; Ren Heming
Sponsor(s): IEEE Beijing Sect
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Beijing, China
Conference Date: 8 August 2005
Volume: 1
ISBN (Paper): 0-7803-9128-4
DOI: 10.1109/MAPE.2005.1617974
Regular:

This paper analyzes the influence of outside environment of the grounding conductor, including the interference source and the ground, on transient grounding resistance (TGR) under pulsed... View More

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