IEEE - Institute of Electrical and Electronics Engineers, Inc. - Easily testable data path allocation using input/output registers

Proceedings of the Fifth Asian Test Symposium (ATS'96)

Author(s): Li-Ren Huang ; Jing-Yang Jou ; Sy-Yen Kuo ; Wen-Bin Liao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Hsinchu, Taiwan
Conference Date: 20 November 1996
Page(s): 142 - 147
ISBN (Paper): 0-8186-7478-4
ISSN (Paper): 1085-7735
DOI: 10.1109/ATS.1996.555151
Regular:

Most existing behavioral synthesis systems concentrate on area and performance optimization, while ignoring other design qualities such as testability. In this paper/sup /spl Dagger//, we present... View More

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