IEEE - Institute of Electrical and Electronics Engineers, Inc. - Localization of Damage in Beam-like Structures by Using Support Vector Machine

Proceedings of 2005 International Conference on Neural Networks and Brain

Author(s): Long Liu ; Guang Meng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Beijing, China
Conference Date: 13 October 2005
Volume: 2
Page(s): 919 - 924
ISBN (Paper): 0-7803-9422-4
DOI: 10.1109/ICNNB.2005.1614770
Regular:

Support vector machine (SVM) is a machine learning algorithm based on statistical learning theory, and it has recently been established as a powerful tool for classification and regression... View More

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