IEEE - Institute of Electrical and Electronics Engineers, Inc. - FDTD Field Strength Prediction for Mobile Microcells

18th International Conference on Applied Electromagnetics and Communications and Joint COST 284 Workshop

Author(s): L. Nagy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Dubrovnik, Croatia
Conference Date: 12 October 2005
Page(s): 1 - 3
ISBN (Paper): 953-6037-44-0
DOI: 10.1109/ICECOM.2005.204924
Regular:

For the built-up macro and microcell widely used semi empirical or empirical models fails for the case if the MS height is near to the rooftop level. In such cases only empirical height correction... View More

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