IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testability analysis of pipelined data paths

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon

Author(s): Buonanno, G. ; Ferrandi, F. ; Sciuto, D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Austin, TX, USA, USA
Conference Date: 9 October 1996
Page(s): 259 - 268
ISBN (Paper): 0-7803-3639-9
ISSN (Paper): 1063-2204
DOI: 10.1109/ICISS.1996.552433
Regular:

The problem of testability analysis for data-processing oriented architectures is considered. In particular, this paper concentrates on the analysis of pipelined architectures containing registers... View More

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