IEEE - Institute of Electrical and Electronics Engineers, Inc. - Towards an integrated sub-nanogram mass measurement system

1996 Proceedings. Eighth Annual IEEE International Conference on Innovative Systems in Silicon

Author(s): Ghodsian, B. ; Chen, J.M. ; Parameswaran, M. ; Syrzycki, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Austin, TX, USA, USA
Conference Date: 9 October 1996
Page(s): 71 - 80
ISBN (Paper): 0-7803-3639-9
ISSN (Paper): 1063-2204
DOI: 10.1109/ICISS.1996.552413
Regular:

This paper reports on developing the working prototype of a miniaturized mass measurement system for measurements of object's mass in the range of nanograms, in liquid and gaseous environments,... View More

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