IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling of capacitor array mismatch effect in embedded CMOS CR SAR ADC

2005 6th International Conference on ASIC Proceedings

Author(s): Zengjin Lin ; Haigang Yang ; Lungui Zhong ; Jiabin Sun ; Shanhong Xia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Shanghai, China
Conference Date: 24 October 2005
Volume: 2
Page(s): 982 - 986
ISBN (Paper): 0-7803-9210-8
DOI: 10.1109/ICASIC.2005.1611492
Regular:

For CR SAR ADCs to be embedded in a system-on-chip, it becomes necessary to acquire how an underlying digital CMOS process that is used to implement the SOC would limit the performance of the ADC... View More

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