IEEE - Institute of Electrical and Electronics Engineers, Inc. - Power property analysis for CMOS integrated circuits

2005 6th International Conference on ASIC Proceedings

Author(s): Yongjun Xu ; Chaonong Xu ; Xiaowei Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Shanghai, China
Conference Date: 24 October 2005
Volume: 2
Page(s): 1,071 - 1,072
ISBN (Paper): 0-7803-9210-8
DOI: 10.1109/ICASIC.2005.1611486
Regular:

Power consumption has become one of the primary constraints of integrated circuit designs, especially for wireless communication environments and battery-operated applications. Some important... View More

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