IEEE - Institute of Electrical and Electronics Engineers, Inc. - IIRW 2005 discussion group summary: product reliability

2005 IEEE International Integrated Reliability Workshop Final Report

Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: S. Lake Tahoe, CA, USA
Conference Date: 17 October 2005
ISBN (Paper): 0-7803-8992-1
DOI: 10.1109/IRWS.2005.1609599
Regular:

The group reported that they are using a variety of times, commonly ranging from 5-10 hours, to 24 hours, to as long as 160 hours. The longer times were generally used in high-reliability... View More

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