IEEE - Institute of Electrical and Electronics Engineers, Inc. - The hole role

International Electron Devices Meeting 2005

Author(s): A.J.P. Theuwissen ; J.T. Bosiers ; E. Roks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Washington, DC, USA
Conference Date: 5 December 2005
Page Count: 4
Page(s): 799 - 802
ISBN (Paper): 0-7803-9268-X
DOI: 10.1109/IEDM.2005.1609476
Regular:

The importance of holes in solid-state image sensors is described. Today's success of digital imaging is based on the positive effect of an accumulation layer that reduces the interface-related... View More

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