IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding a lasting interface for your ATE system

AUTOTESTCON 2005

Author(s): J. Swanstrom
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 7
Page(s): 732 - 738
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609227
Regular:

The paper examines the interface considerations required in military and defense automated test systems to interface to a computer, for measurement automation. This paper examines the drivers for... View More

Advertisement