IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using new instrument interface standards to increase automatic test system performance

AUTOTESTCON 2005

Author(s): R. Sethunadh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 6
Page(s): 677 - 682
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609216
Regular:

The performance of automatic test system is always closely linked to the performance of the instrument interface architecture used in the system. The evolution of various instrument interface... View More

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