IEEE - Institute of Electrical and Electronics Engineers, Inc. - Deploying support forward-bringing deep test capability to forward areas

AUTOTESTCON 2005

Author(s): D. MacLennan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 7
Page(s): 540 - 546
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609194
Regular:

The paper considers the hypothesis that advances in test technology, including sophisticated test software means that more test and diagnostic capability can be provided in smaller, transportable... View More

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