IEEE - Institute of Electrical and Electronics Engineers, Inc. - Resource switching the cornerstone for a modular scalable test set solution

AUTOTESTCON 2005

Author(s): H. Wehrman ; J. Lum
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 14
Page(s): 510 - 523
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609190
Regular:

The purpose of this paper is to propose a test system architecture to the test community that has the potential of being the cornerstone of such a system, coming closer to implementation than... View More

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