IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated test equipment synthetic instrumentation

AUTOTESTCON 2005

Author(s): E.H. Dare
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 5
Page(s): 175 - 179
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609123
Regular:

When the USAF's F-15 became operational in the mid-1970s, intermediate avionics test support was provided by specific test stations designed to support technology workload groups, ranging from... View More

Advertisement