IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated calibration and diagnostics for synthetic instruments

AUTOTESTCON 2005

Author(s): R.J. Martinek ; M.P. Molloy ; S.D. Pepin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 16
Page(s): 120 - 135
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609114
Regular:

This paper describes the automated software based calibration and diagnostics tools used to maintain a "real world", high speed/high performance synthetic instrument based RF test system targeted... View More

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