IEEE - Institute of Electrical and Electronics Engineers, Inc. - Plenary diagnostics: benefits and challenges

AUTOTESTCON 2005

Author(s): J.K. Scully
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 8
Page(s): 76 - 83
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609106
Regular:

Plenary diagnostics formalizes event driven threads of data propagated through successive diagnostic levels. It rests on a clear distinction between the notions of an anomaly, a fault and a... View More

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