IEEE - Institute of Electrical and Electronics Engineers, Inc. - Expanding LXI class C implementations into low cost applications beyond the "standard" test instrumentation functions

AUTOTESTCON 2005

Author(s): R. Judd
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 4
Page(s): 68 - 71
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609103
Regular:

The original concept of the LXI consortium was to provide a LAN standard for classic rack-and-stack and bench top instruments such as DMMs, scopes, waveform generators, etc. as well as for the... View More

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