IEEE - Institute of Electrical and Electronics Engineers, Inc. - Exploring LXI's advanced capabilities

AUTOTESTCON 2005

Author(s): P. Franklin ; A. Creque ; R. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Orlando, FL, USA
Conference Date: 26 September 2005
Page Count: 7
Page(s): 61 - 67
ISBN (Paper): 0-7803-9101-2
DOI: 10.1109/AUTEST.2005.1609102
Regular:

The proposed LXI (LAN extensions for instrumentation) specification defines a rich collection of capabilities that allow LAN-connected instruments to perform sophisticated test and measurement... View More

Advertisement