IEEE - Institute of Electrical and Electronics Engineers, Inc. - Backscattering from a spatial random permittivity plate: a statistical approach

2005 European Microwave Conference

Author(s): G. Dauron ; M.F. Wong ; E. Richalot ; O. Picon ; J. Wiart
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 2
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1610179
Regular:

This paper presents a way of finding a correlation between a scattering plate with spatial random permittivity and its far field diffraction diagram when illuminated by a plane wave. The random... View More

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