IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mastering parasitics in complex MEMS circuits

2005 European Microwave Conference

Author(s): P. Arcioni ; G. Conciauro ; P. Farinelli ; P. Mezzanotte ; M. Repossi ; L. Vietzorreck
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 2
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1610083
Regular:

Because of the tight coupling between closely spaced 3-D elements, parasitic effects often degrade the overall performance of complex MEMS circuits. A single-pole-double-throw (SPDT) switch... View More

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