IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fully calibrated four channels time domain RF envelope measurement system for the envelope characterization of nonlinear devices in a load-pull environment

2005 European Microwave Conference

Author(s): F. Macraigne ; T. Reveyrand ; C. Maziere ; D. Barataud ; J.M. Nebus ; R. Quere ; A. Mallet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 2
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1610029
Regular:

This paper presents a fully calibrated four channels time domain radio-frequency (RF) envelope characterization system. This measurement system enables the acquisition and the vector-correction of... View More

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