IEEE - Institute of Electrical and Electronics Engineers, Inc. - Further study on two-thickness-method for simultaneous measurement of complex EM parameters based on open-ended coaxial probe

2005 European Microwave Conference

Author(s): Chun-Ping Chen ; Zhewang Ma ; Tetsuo Anada ; Jui-Pang Hsu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 1
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1608904
Regular:

Two-thickness-method (TTM) based on an open-ended coaxial probe is investigated in this paper with an emphasis on uncertainty analysis. Uncertainty equations in differential forms are... View More

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