IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analytical modeling of defects in 3D-PBG

2005 European Microwave Conference

Author(s): L. Oyhenart ; V. Vigneras ; J.P. Parneix
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 1
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1608859
Regular:

The modeling of defects in PBG by traditional numerical methods is difficult because it requires much memory and computing time. An analytical method of multiple-scattering solves this typical... View More

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