IEEE - Institute of Electrical and Electronics Engineers, Inc. - Substrate isolation in 90nm RF-CMOS technology

2005 European Microwave Conference

Author(s): C. Barbier-Petot ; S. Bardy ; C. Biard ; P. Descamps
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 4 October 2005
Volume: 1
Page Count: 4
ISBN (Paper): 2-9600551-2-8
DOI: 10.1109/EUMC.2005.1608800
Regular:

Substrate coupling on advanced high-speed and RF integrated circuits can have a significant impact on circuit performances. This parasitic effect is studied in the present paper in a triple-well... View More

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