IEEE - Institute of Electrical and Electronics Engineers, Inc. - Lifetime characterization of capacitive power RF MEMS switches

2005 13th European Gallium Arsenide and other Compound Semiconductors Application Symposium

Author(s): A. Ziaei ; T. Dean ; Y. Mancuso
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 3 October 2005
Page Count: 4
Page(s): 509 - 512
ISBN (Paper): 88-902012-0-7
DOI: 10.1109/EUMC.2005.1610224
Regular:

RF MEMS switches provide a low-cost, high performance solution to many RF/microwave applications and these switches will be important building blocks for designing phase shifters, switched filters... View More

Advertisement