IEEE - Institute of Electrical and Electronics Engineers, Inc. - A simple technique for measuring the thermal impedance and the thermal resistance of HBTs

2005 13th European Gallium Arsenide and other Compound Semiconductors Application Symposium

Author(s): J.A. Lonac ; A. Santarelli ; I. Melczarsky ; F. Filicori
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Paris, France
Conference Date: 3 October 2005
Page Count: 4
Page(s): 197 - 200
ISBN (Paper): 88-902012-0-7
Regular:

This paper presents a new and simple method for characterizing the thermal behavior of heterojunction bipolar transistors, based on DC, AC and low frequency small signal measures of H (hybrid)... View More

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