IEEE - Institute of Electrical and Electronics Engineers, Inc. - Minimizing the Lengths of Test Sequences with Overlapping

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): Fan Zhang ; R.L. Probert
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 2,355 - 2,359
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604599
Regular:

In finite-state machine (FSM) based testing, it is highly desirable to minimize the test sequence length while achieving a certain level of fault coverage. This article, assuming the presence of a... View More

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