IEEE - Institute of Electrical and Electronics Engineers, Inc. - Single Fault Models for Timed FSMs

Proceedings of the IEEE Instrumentation and Measurement Technology Conference

Author(s): M. Umit Uyar ; Yu Wang ; S.S. Batth ; A. Wise ; M.A. Fecko
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Conference Location: Ottawa, Ont., Canada
Conference Date: 16 May 2005
Volume: 3
Page(s): 2,349 - 2,354
ISBN (Paper): 0-7803-8879-8
DOI: 10.1109/IMTC.2005.1604598
Regular:

The classification and detection of single timing faults in timed FSMs are introduced. A graph augmentation method is used to formulate the detection models for timing faults. It is shown that, by... View More

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